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Product
MCU Aging Line
Sub-scheme Overview (Quantitative Description):

Screen out early faults and improve product lifespan through power cycling and high-temperature aging.
Product Description

Sub-scheme Overview (Quantitative Description):

Screen out early faults and improve product lifespan through power cycling and high-temperature aging.

Main Processes (Process Flow Points):

Automatic Power On、Simulated Load Operation、High-Low Temperature Cycling、Aging Monitoring、Performance Retest


Features / Advantages:

Multi-channel parallel aging、Real-time IGBT junction temperature monitoring、Load simulates motors with different power ratings


Unit Composition:

Aging Test Rack、Power Cycling System、Thermal Shock System、Online Monitoring System

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