An advanced non-destructive testing technology that generates 3D voxel data and provides more comprehensive and accurate internal information of objects.
Circular CT :
Dual-angle image acquisition in as fast as 3 seconds;Real-time reconstruction & automatic detection < 1.5s;
Maximum field of view > 70mm (under specific configurations);
150kV or 180kV integrated sealed tube available; 98μm CMOS flat panel or 100μm TFT flat panel available;
Free scanning mode with arbitrary angle and arbitrary speed; Maximum rotation speed: 30°/s;
Maximum rotation angle: 360°;
Maximum magnification: 10×;
Continuous forward and reverse rotation clockwise or counterclockwise.
Benchtop CT :
Flat-Panel CT :
This system is a high-throughput automated planar CT inspection platform designed for PCBs and electronic components.
It adopts precision in-plane 360° circular scanning technology and also features a fast linear scanning mode, achieving a technological breakthrough of "reconstruction while scanning". It enables high-precision inspection of multi-layer complex samples in the field of semiconductor advanced packaging
2D X-Ray:








