Against the current backdrop, emerging display technologies such as Micro-LED and Micro-OLED are witnessing continuous technical breakthroughs, ushering the panel display industry into a new round of technological revolution. Serving as a core growth engine, these innovations strongly accelerate iteration and real-scene commercialization of AR/VR display terminals, making full-process, high-precision and high-efficiency inspection solutions a core industry demand.

Specializing in display measurement and inspection, Jingce Electronic made a powerful debut with its cutting-edge measurement & inspection solutions, intelligent inspection equipment and precision testing instruments. The company fully demonstrated its full-stack technical capabilities and comprehensive product portfolio for emerging display measurement and inspection, delivering industry-leading one-stop measurement and inspection technical services to clients.

Deep integration of AI with measurement and inspection enables pixel-level color management, high-precision spectral analysis and intelligent judgment of appearance defects, forming a closed-loop full-link data system. This not only meets the stringent yield and takt time requirements of mass production lines for display panels and AR/VR products, but also delivers a highly scalable technical platform to address future measurement and inspection demands for semiconductor displays and flexible display devices, facilitating the industrialization of cutting-edge emerging display technologies.

Prober ATE Test Equipment

Capable of wafer testing and bin sorting, this equipment is equipped with expandable high-current DPS boards and highly integrated digital PE boards inside. It supports testing of 4–12-inch Micro-LED/Micro-OLED wafers and works with mainstream probers to realize fully automated testing, drastically boosting testing efficiency.

Prober AOI Inspection Equipment

Integrating self-developed high-precision spectrophotometers, signal generators and high-precision PU pressure contact modules, this equipment features constant-temperature high-precision performance. It enables synchronous inspection of spectrum and luminance defects, balancing inspection accuracy and throughput to guarantee consistent wafer-level yield and quality. It serves as a lighting AOI and spectral testing device for 4/6/8/12-inch Micro-LED/Micro-OLED wafers.

Gamma Calibration Equipment

Equipped with self-developed signal generators, high-precision probes and high-speed algorithms, this highly integrated device delivers core strengths of fast debugging and ultra-precise calibration. It fully supports Auto Gamma functions for full-range product calibration, ensuring both calibration efficiency and optimal post-calibration display performance.

SLT AOI Inspection Equipment

A turnkey mass-production solution for automatic AOI and DeMura inspection of Micro-LED microdisplay modules, this device features fully automatic tray loading and standardized, highly integrated hardware design compatible with all mainstream product sizes on the market. It boasts outstanding advantages in detection rate, throughput and precision. Its innovative multi-station batch design substantially improves large-scale module inspection efficiency.

NED AOI Inspection Equipment

Fitted with self-developed NED instruments and lenses, this all-in-one system integrates automatic pressure contact units, signal generators, dedicated software and proprietary algorithms. It supports multiple functions including defect detection, display performance measurement and virtual image distance evaluation, fulfilling diverse inspection needs with one-stop service. It is deployed for automated optical performance testing of core AR/VR modules (AR Projector, VR Pancake) and end-user AR/VR products.

At this exhibition, Jingce Electronic unveiled a suite of intelligent optical instruments: the ISPM-MRGB-61 multi-point spectral enhanced colorimeter, TVCM-03X multi-viewing-angle spectrum analyzer, TCM-03N high-precision near-eye display spectrophotometer, NED-CF-151 filter-type near-eye display colorimeter, and NED-MRGB-151+V3.1 imaging-type near-eye display spectrophotometer. These products tackle prevalent industrial pain points such as measurement errors caused by spectral shift during viewing-angle testing and spectral mismatch in multi-zone measurement. They support testing of luminance and chrominance, spectral data, viewing angles, Gamma calibration and color uniformity. The company systematically showcased a full lineup of precision optical and electrical instruments, delivering efficient and reliable inspection solutions for complex operating environments.

For its decade-long staunch support for the ICDT conference and exceptional technical contributions to the display industry, Jingce Electronic was honored with the ICDT 10th Anniversary Outstanding Partner Award, standing alongside industrial chain partners to witness high-quality growth of China’s display sector.

Liu Ronghua, Director and Deputy General Manager of Jingce Electronic Group (fourth from left), took the stage to receive the award.

During the exhibition, Mr. Jiang Baokun, Senior Product Director of Jingce Electronic, and Dr. Liu Luning, Senior Research Specialist from X-Lab, delivered two exclusive technical keynote speeches respectively. Drawing on Jingce Electronic’s in-depth research and market practice, they shared forward-looking insights and targeted solutions for emerging displays, demonstrating the company’s technological foresight and robust R&D strength in emerging display inspection.

Mr. Jiang Baokun delivered a keynote titled Innovative Inspection Technology for Advanced Micro Display. Focusing on critical industrial bottlenecks in mass production of CMOS Micro-LED, his speech addressed full-chain technical challenges spanning wafer electrical testing, wafer optical lighting inspection, optoelectronic debugging and defect screening for modules, and performance calibration of finished AR terminals. He elaborated on innovative technical principles, differentiated performance strengths and precise application scenarios of four core inspection devices: Prober ATE, Prober AOI, SLT AOI and NED AOI. He also presented Jingce Electronic’s customized, integrated and full-process intelligent measurement & inspection solutions, which effectively boost product yield, cut production costs and raise throughput, comprehensively accelerating commercialization and large-scale industrial development of CMOS Micro-LED technology.

Leading Precision Inspection Technology, Forging Ultimate Visual Experience. Jingce's landmark appearance at ICDT 2026 represents a concentrated showcase of its full-stack inspection capabilities, as well as a vital initiative to deeply integrate into the global emerging display industrial ecosystem and drive cross-industry technical upgrading. As a domestic leader in display measurement and inspection, Jingce Electronic has achieved full coverage of full-process inspection systems across both conventional and next-generation display sectors, building an intelligent inspection ecosystem encompassing precision testing instruments, intelligent inspection equipment and customized industrial solutions.

Going beyond inspection to enable proactive yield management. Moving forward, Jingce will keep scaling up R&D investment in measurement and inspection for next-generation displays. Centering on cutting-edge emerging display technologies including Micro-LED, Micro-OLED, AR and VR, the company will continuously break through technical bottlenecks in high precision, high throughput and high stability inspection. It will further deepen industrial chain collaboration, empower the development of the display industry through leading process inspection and yield management solutions, and help the global display sector embark on a new journey of higher-quality and faster growth.